Schlangen, Rudolf: search on Z-Library

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1

[IEEE 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, Jiangsu, China (2009.07.6-2009.07.10)] 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - RF performance increase allowing IC timing adjustments by use of backside FIB processing

Schlangen, Rudolf, Leihkauf, Rainer, Lundquist, Ted, Egger, Peter

Year:

2009

Language:

english

File:

PDF, 8.63 MB

english, 2009

2

[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Failure analysis of low-ohmic shorts using lock-in thermography

Wadhwa, Kannu, Schlangen, Rudolf, Liao, Joy, Ton, Tung, Marks, Howard

Year:

2014

Language:

english

File:

PDF, 1.35 MB

english, 2014

3

[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Non-destructive defect depth determination at fully packaged and stacked die devices using Lock-in Thermography

Schmidt, Christian, Altmann, Frank, Schlangen, Rudolf, Deslandes, Herve

Year:

2010

Language:

english

File:

PDF, 1.83 MB

english, 2010

4

Focused ion beam contact to non-volatile memory cells

Helfmeier, Clemens, Schlangen, Rudolf, Boit, Christian

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 1.24 MB

english, 2014

5

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Trimming of IC timing and delay by backside FIB processing - comparison of conventional and strained technologies

Schlangen, Rudolf, Leihkauf, Rainer, Lundquist, Ted, Egger, Peter, Kerst, Uwe, Boit, Christian

Year:

2008

Language:

english

File:

PDF, 1.56 MB

english, 2008

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